• DocumentCode
    3153554
  • Title

    A new smart Vth-extraction methodology considering recovery and mobility degradation due to NBTI

  • Author

    Schlünder, Christian ; Hoffmann, Marcel ; Vollertsen, Rolf-Peter ; Schindler, Günther ; Heinrigs, Wolfgang ; Gustin, Wolfgang ; Reisinger, Hans

  • Author_Institution
    Infineon Technol. AG, Munich
  • fYear
    2007
  • fDate
    15-18 Oct. 2007
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    In the recent literature several measurement methods were introduced to characterize the Vth-degradation of NBTI considering the recovery phenomenon. To our knowledge each method has a severe problem or at least a significant disadvantage. Either there are long delay times, the accuracy is not satisfactory or it is not possible to implement the method with customary equipment. A compromise is to do a one point measurement in the subthreshold region and calculate Vth based on the assumption that the subthreshold slope is not or only marginally affected by NBTI. In this paper we disprove the universality of this assumption. Vth determination using a one point measurement can lead to imprecise values. This extraction method disregards mobility degradation after NBTI impacting Vth, which we have clearly obtained in our measurements. We introduce a new smart Vth extraction methodology offering both shortest possible delay times with customary equipment and consideration of mobility degradation effects.
  • Keywords
    semiconductor device measurement; semiconductor device reliability; NBTI; V-extraction methodology; mobility degradation; CMOS technology; Current measurement; Degradation; Delay effects; Niobium compounds; Plasma measurements; Proposals; Stress measurement; Threshold voltage; Titanium compounds;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Integrated Reliability Workshop Final Report, 2007. IRW 2007. IEEE International
  • Conference_Location
    S. Lake Tahoe, CA
  • ISSN
    1930-8841
  • Print_ISBN
    978-1-4244-1771-9
  • Electronic_ISBN
    1930-8841
  • Type

    conf

  • DOI
    10.1109/IRWS.2007.4469211
  • Filename
    4469211