• DocumentCode
    3153688
  • Title

    Practical technique for measurements of second-order nonlinearities in thermally poled glasses

  • Author

    Corbari, C. ; Deparis, O. ; Klappauf, B.G. ; Kazansky, P.G.

  • Author_Institution
    Optoelectron. Res. Centre, Southampton Univ., UK
  • fYear
    2003
  • fDate
    22-27 June 2003
  • Firstpage
    214
  • Abstract
    In this work we present a practical and nondestructive technique for measuring the thickness and the magnitude of χ(2) in thermally poled glasses. Theoretical analysis shows that thickness, as small as 4 μm, can be measured with less than 10% error. The resolution is estimated in about 1 μm. The technique is tested on a set of poled silica sample and the poling dynamic as well as the χ(2) evolution are derived.
  • Keywords
    dielectric polarisation; nonlinear optical susceptibility; optical glass; optical harmonic generation; silicon compounds; thickness measurement; χ(2) magnitude measurement; 4 micron; SiO2; nondestructive technique; poled silica sample; poling dynamic; resolution; second-order nonlinearities; thermally poled glasses; thickness measurement; Glass;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics Europe, 2003. CLEO/Europe. 2003 Conference on
  • Print_ISBN
    0-7803-7734-6
  • Type

    conf

  • DOI
    10.1109/CLEOE.2003.1312275
  • Filename
    1312275
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3153688