• DocumentCode
    3153736
  • Title

    RTG: Automatic Register Level Test Generator

  • Author

    Shteingart, Semyon ; Nagle, Andrew W. ; Grason, John

  • Author_Institution
    AT&T Bell Laboratories, Summit, NJ
  • fYear
    1985
  • fDate
    23-26 June 1985
  • Firstpage
    803
  • Lastpage
    807
  • Abstract
    The Register level Test Generator (RTG) system is a software tool that automatically develops test patterns to detect all classical single "stuck-at" faults in a digital circuit. In its current state RTG is targeted for boards containing SSI, MSI, and small LSI components. RTG combines an efficient technique for modeling sequential components at the register level with a simple set of testability design rules, and a powerful test generation algorithm. Thus far in its development RTG has been shown to be a useful tool, typically capable of generating a 100% fault coverage test for a 50 IC board in about 30 CPU minutes on a VAX 11/780 runing UNIX.
  • Keywords
    Automatic test pattern generation; Automatic testing; Circuit faults; Circuit testing; Registers; Sequential analysis; Software testing; Software tools; System testing; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation, 1985. 22nd Conference on
  • ISSN
    0738-100X
  • Print_ISBN
    0-8186-0635-5
  • Type

    conf

  • DOI
    10.1109/DAC.1985.1586041
  • Filename
    1586041