Title :
Proceedings. 1st International Workshop on Testability Assessment (IEEE Cat. No.04EX983)
Abstract :
The following topics are dealt with: overview of testability needs and solutions; design-for-testability; metrics and tools; about testability - past, present, and future.
Keywords :
boundary scan testing; circuit testing; design for testability; program testing; technological forecasting; design-for-testability; future testability; metrics; testability assessment; testability needs; testability tools;
Conference_Titel :
Testability Assessment, 2004. IWoTA 2004. Proceedings. First International Workshop on
Conference_Location :
Rennes, France
Print_ISBN :
0-7803-8851-8
DOI :
10.1109/IWOTA.2004.1428394
