DocumentCode
3153782
Title
A Functional Partitioning Expert System for Test Sequences Generation
Author
Delorme, C. ; Roux, P. ; Demians, L. ; Archimbaud, D. ; Giambiasi, N. ; Bath, R.L. ; Gee, B. Mac ; Charroppin, R.
Author_Institution
CIMSA, VELIZY, France
fYear
1985
fDate
23-26 June 1985
Firstpage
820
Lastpage
824
Abstract
In this paper, we describe a functional partitioning Expert System. Our ultimate goal is the generation of test sequences for digital circuits, using both conventional tools and AI techniques. We describe at first an open infrastructure we are implementing, it allows the integration of specific tools (e.g. expert systems) in a hierarchical description of technical systems. Then we present the partitioning Expert System we are building, being the first step towards test generation at board level.
Keywords
Automatic testing; Circuit testing; Digital circuits; Expert systems; Integrated circuit modeling; Integrated circuit testing; Performance evaluation; Software testing; System testing; Test pattern generators;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation, 1985. 22nd Conference on
ISSN
0738-100X
Print_ISBN
0-8186-0635-5
Type
conf
DOI
10.1109/DAC.1985.1586045
Filename
1586045
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