DocumentCode
3154379
Title
The design, qualification and use of bypass diode integration onto GaAs/Ge solar cells
Author
Dally, R.B. ; Kululka, J.R. ; Schwartz, J.A.
Author_Institution
Spectrolab Inc., Sylmar, CA, USA
fYear
1996
fDate
13-17 May 1996
Firstpage
333
Lastpage
335
Abstract
Bypass diodes are integrated onto GaAs/Ge solar cells by selectively thinning a pocket into the backside of the solar cell´s germanium substrate, electrically connecting the two devices via insulated metal foil tabs (Ag, Ag/Kovar or Ag/Mo) attached by thermal compression bonding (welding) and/or soldering and bonding the 3 mm thick silicon diode chip into the germanium pocket with a standard space qualified adhesive. This efficient and synergistic method of integration maintains the modularity of the solar cell unit, minimizes active area obscuration, heat sinks the diode and eliminates the need for discrete bypass diode wiring at the solar panel level. The approach is also applicable to future high efficiency, multijunction solar cells. Qualification status, performance results and manufacturing capabilities are discussed
Keywords
III-V semiconductors; aerospace testing; elemental semiconductors; gallium arsenide; germanium; photovoltaic power systems; semiconductor device testing; solar cell arrays; solar cells; soldering; space vehicle power plants; GaAs-Ge; GaAs/Ge space power solar cells; applications; bypass diode integration; design; insulated metal foil tabs; manufacturing capabilities; performance; qualification; selective thinning; soldering; space qualified adhesive; thermal compression bonding; Bonding; Dielectrics and electrical insulation; Diodes; Gallium arsenide; Germanium; Joining processes; Photovoltaic cells; Qualifications; Soldering; Welding;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference, 1996., Conference Record of the Twenty Fifth IEEE
Conference_Location
Washington, DC
ISSN
0160-8371
Print_ISBN
0-7803-3166-4
Type
conf
DOI
10.1109/PVSC.1996.564013
Filename
564013
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