DocumentCode :
315442
Title :
Material Characterization By Tem
Author :
Iijima, Sumio
fYear :
1997
fDate :
16-18 April 1997
Firstpage :
10
Lastpage :
12
Keywords :
Carbon nanotubes; Crystallization; Electron microscopy; Grain boundaries; Optical filters; Surface cleaning; Surface morphology; Surface reconstruction; Surface structures; Transmission electron microscopy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
IEMT/IMC Symposium, 1997., 1st [Joint International Electronic Manufacturing Symposium and the International Microelectronics Conference]
Conference_Location :
IEEE
Print_ISBN :
0-7803-4235-6
Type :
conf
Filename :
618968
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=315442
