DocumentCode
315442
Title
Material Characterization By Tem
Author
Iijima, Sumio
fYear
1997
fDate
16-18 April 1997
Firstpage
10
Lastpage
12
Keywords
Carbon nanotubes; Crystallization; Electron microscopy; Grain boundaries; Optical filters; Surface cleaning; Surface morphology; Surface reconstruction; Surface structures; Transmission electron microscopy;
fLanguage
English
Publisher
ieee
Conference_Titel
IEMT/IMC Symposium, 1997., 1st [Joint International Electronic Manufacturing Symposium and the International Microelectronics Conference]
Conference_Location
IEEE
Print_ISBN
0-7803-4235-6
Type
conf
Filename
618968
Link To Document