• DocumentCode
    3154545
  • Title

    A compact microstrip two-layers bandpass filter using improved interdigital-loop resonators

  • Author

    Boonlom, Kamol ; Pratumvinit, Teerapan ; Akkaraekthalin, Prayoot

  • Author_Institution
    Chiangrai Rajabhat Univ., Chiangrai, Thailand
  • fYear
    2009
  • fDate
    Jan. 9 2009-Dec. 11 2009
  • Firstpage
    367
  • Lastpage
    370
  • Abstract
    In this paper we present a new compact two-layers microstrip bandpass filter using multilayer cross-coupled improved interdigital-loop resonators. The filter structure consists of four resonators placed on two microstrip stack layers. The coupling between the resonators on the upper layer and the lower layer is obtained by using three coupling apertures on the common ground plane. The full-wave simulator IE3D has been employed to design the interdigital-loop resonators and to calculate the coupling coefficients between resonators of the filter. Finally, the filter has been optimized, resulting to low passband insertion loss (less than 3 dB) and high return loss (higher than 20 dB) at the center frequency. By using this two-layer technique in the microwave filter design, a filter size reduction of about 50% is obtained. These features make the proposed structure suitable for compact and high-performance circuit component designs in microwave integrated circuit (MMIC).
  • Keywords
    MMIC; band-pass filters; microstrip filters; resonator filters; MMIC; compact microstrip two-layers bandpass filter; full-wave simulator IE3D; microwave filter design; microwave integrated circuit; multilayer cross-coupled improved interdigital-loop resonators; Apertures; Band pass filters; Frequency; Insertion loss; Microstrip filters; Microstrip resonators; Microwave filters; Nonhomogeneous media; Passband; Resonator filters; Bandpass filter; microstrip filter; size reduction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radio-Frequency Integration Technology, 2009. RFIT 2009. IEEE International Symposium on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-5031-2
  • Electronic_ISBN
    978-1-4244-5032-9
  • Type

    conf

  • DOI
    10.1109/RFIT.2009.5383685
  • Filename
    5383685