• DocumentCode
    3154613
  • Title

    Modeling of printed periodic structures with thick metal patches by the MoM/BI-RME method

  • Author

    Bozzi, Maurizio ; Montagna, Maria ; Perregrini, Luca

  • Author_Institution
    Dept. of Electron., Univ. of Pavia, Pavia, Italy
  • fYear
    2010
  • fDate
    23-28 May 2010
  • Firstpage
    692
  • Lastpage
    695
  • Abstract
    This paper presents a novel technique for the accurate modeling of printed periodic structures with thick metal patches. These structures include capacitive frequency selective surfaces (FSS) and metallo-dielectric electromagnetic band-gap (EBG) structures, and are typically modeled under the hypothesis of infinitely thin metal patches. Nevertheless, taking into account the finite thickness of the patches allows for a more accurate modeling, especially at mm-wave frequency, as well as for a better evaluation of conductor losses. The analysis technique proposed in this paper is based on the MoM/BI-RME method and permits to obtain an accurate and computationally efficient modeling tool. A validation example is reported in the case of a capacitive FSS and is compared to the results obtained with a commercial full-wave electromagnetic software.
  • Keywords
    frequency selective surfaces; photonic band gap; MoM/BI-RME method; capacitive frequency selective surfaces; conductor losses; full-wave electromagnetic software; metallo-dielectric electromagnetic band-gap structures; printed periodic structures; thick metal patches; thin metal patches; Computational modeling; Conductors; Dielectric substrates; Electromagnetic modeling; Frequency selective surfaces; Geometry; Integral equations; Metamaterials; Periodic structures; Planar arrays; Periodic structures; electromagnetic band-gap structures; frequency selective surfaces; integral-equation method;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest (MTT), 2010 IEEE MTT-S International
  • Conference_Location
    Anaheim, CA
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4244-6056-4
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2010.5518166
  • Filename
    5518166