DocumentCode :
3155004
Title :
Automatic Generation of Self-Test Programs - A New Feature of the MIMOLA Design System
Author :
Krüger, Gerd
Author_Institution :
Institut fur Informatik u. Prakt. Math., Universitat Kiel, Kiel, W. Germany
fYear :
1986
fDate :
29-2 June 1986
Firstpage :
378
Lastpage :
384
Abstract :
A method to automatically generate functional self-test programs for arbitrary processor systems including microprogrammable and custom designed special purpose types is presented. Only commonly available user information is needed, but gate-level details can be utilized as well. The generated self-test programs perform user guided tests for memory function and register decoding, functional or gate-level derived tests for combinational modules, and a machine status check to detect undesired side-effects. The programs are given in the micro- or machine code of the target system, ready for execution. First applications have shown promising results.
Keywords :
Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Hardware; Microprogramming; Registers; Software systems; Software testing; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation, 1986. 23rd Conference on
ISSN :
0738-100X
Print_ISBN :
0-8186-0702-5
Type :
conf
DOI :
10.1109/DAC.1986.1586117
Filename :
1586117
Link To Document :
بازگشت