DocumentCode :
3155124
Title :
A new extraction method for the characteristic impedance and effective dielectric constant of transmission line with DGS
Author :
Kang, Minwoo ; Park, Sunju ; Kim, Kwisoo ; Han, Sang-Min ; Lim, Jongsik ; Choi, Kwansun ; Ahn, Dal
Author_Institution :
Dept. of Electr. Commun. Syst. Eng., Soonchunhyang Univ., Asan, South Korea
fYear :
2009
fDate :
Jan. 9 2009-Dec. 11 2009
Firstpage :
265
Lastpage :
268
Abstract :
In this paper, we propose a new extraction method for the characteristic impedance and effective dielectric constant of a microstrip line. It extracts the characteristic impedance and effective dielectric constant of a microstrip line that uses the results of S-parameters through the EM-simulation. And it also extracts the characteristic impedance and effective dielectric constant of microstrip line with DGS and compare the variation of frequency response. We simulate a microstrip line which has a dumbbell type DGS, and extract the electrical length, characteristic impedance and effective dielectric constant according to the DGS´s size and the number of DGS. From these results, we analyze how DGS influence the variation of the transmission line characteristics such as the characteristic impedance and effective dielectric constant of a microstrip line.
Keywords :
S-parameters; defected ground structures; microstrip lines; permittivity; transmission lines; EM-simulation; S-parameter; characteristic impedance; defected ground structure; dielectric constant; dumbbell type DGS; extraction method; microstrip line; transmission line; Admittance; Clocks; Dielectric constant; Distributed parameter circuits; Frequency response; Impedance; Microstrip; Radio frequency; Systems engineering and theory; Transmission lines; DGS (Defected Ground Structure); Microstrip line; S-Parameter; characteristic impedance; effective dielectric constant; electrical length;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radio-Frequency Integration Technology, 2009. RFIT 2009. IEEE International Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-5031-2
Electronic_ISBN :
978-1-4244-5032-9
Type :
conf
DOI :
10.1109/RFIT.2009.5383712
Filename :
5383712
Link To Document :
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