Title :
Built-in self test for content addressable memories
Author :
Kang, Yong Seok ; Lee, Jong Cheol ; Kang, Sungho
Author_Institution :
Dept. of Electr. Eng., Yonsei Univ., Seoul, South Korea
Abstract :
A new parallel test algorithm and a Built-in Self Test (BIST) architecture for an efficient testing of various types of functional faults in Content Addressable Memories (CAMs) are developed. In test mode, the read operation is replaced by one parallel content addressable search operation and the writing operation is performed parallel with small peripheral circuit modifications. The results show that an efficient and practical testing with very low complexity and area overhead can be achieved
Keywords :
built-in self test; content-addressable storage; fault diagnosis; Built-in Self Test; CAMs; area overhead; content addressable memories; functional faults; low complexity; parallel test algorithm; Associative memory; Automatic testing; CADCAM; Computer aided manufacturing; Logic; Registers;
Conference_Titel :
Computer Design: VLSI in Computers and Processors, 1997. ICCD '97. Proceedings., 1997 IEEE International Conference on
Conference_Location :
Austin, TX
Print_ISBN :
0-8186-8206-X
DOI :
10.1109/ICCD.1997.628848
