Title :
Mixed-Level Fault Coverage Estimation
Author :
Ma, Hi Keung ; Vincentelli, Alberto L Sangiovanni
Author_Institution :
Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, CA
Abstract :
A Fault coverage estimation technique for mixed-level circuit is described. Observability formulae for combinational multiple-input multiple-output functional block are derived. Special procedures for estimating CMOS circuit transistor fault detection probability are developed, and the implementation of a FAult Coverage Estimation (FACE) system is described.
Keywords :
Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Electrical fault detection; Face detection; Fault detection; MIMO; Observability; Very large scale integration;
Conference_Titel :
Design Automation, 1986. 23rd Conference on
Print_ISBN :
0-8186-0702-5
DOI :
10.1109/DAC.1986.1586142
