Solutions for input impedance matching of nanodevices: Application to Y-Branch Junction HF to DC rectifier

Author

Bednarz, Lukasz ; Rashmi ; Farhi, Ghania ; Hackens, Benoît ; Bayot, Vincent ; Huynen, Isabelle

Author_Institution

Microwave Lab., Univ. catholique de Louvain, Louvain-la-Neuve

fYear

2006

fDate

10-13 Sept. 2006

Firstpage

5

Lastpage

8

Abstract

The problem of high input impedance of nanoscaled devices is analyzed for the case of a Y-Branch Junction. An electrical nonlinear model of YBJs validated on measured data is used to show influence of source impedance on HF to DC detection performance in YBJ. An impedance matching network is proposed and is proven to increase the detection sensitivity. Multiple 2DEG channels material used to fabricate parallel YBJ´s stacked on one another is also proposed as an alternative solution to mismatch problem. It is shown that using multiple 2DEG the input impedance and reflection coefficient can be decreased but at the price of decrease in sensitivity

Keywords

impedance matching; nanotechnology; rectifiers; DC rectifier; HF rectifier; Y-branch junction; detection sensitivity; electrical nonlinear model; high input impedance; impedance matching; nanoscaled devices; Contact resistance; Cutoff frequency; Electric variables measurement; Electrons; Hafnium; Impedance matching; Impedance measurement; Laboratories; Nanoscale devices; Rectifiers;

fLanguage

English

Publisher

ieee

Conference_Titel

European Microwave Integrated Circuits Conference, 2006. The 1st

Conference_Location

Manchester

Print_ISBN

2-9600551-8-7

Type

conf

DOI

10.1109/EMICC.2006.282735

Filename

4057558