DocumentCode
3156206
Title
Development of InGaAs radiation thermometers
Author
Sakuma, Fumihiro ; Ma, Laina
Author_Institution
Nat. Metrol. Inst. of Japan (NMIJ), Nat. Inst. of Adv. Ind. Sci. & Technol. (AIST), Tsukuba
fYear
2008
fDate
20-22 Aug. 2008
Firstpage
1614
Lastpage
1617
Abstract
In 1996 an InGaAs radiation thermometer was developed for the temperature range from 150degC to 1100degC. The quality was good except for the size of source effect (SSE). NMIJ and Chino jointly developed a technique for reducing the SSE by using a ray trace method in the design of the objective lens of 0.65 mum and 0.9 mum radiation thermometers. We applied this technique to develop new InGaAs radiation thermometers with the measuring wavelength of 1.6 mum and 2 mum and their SSEs were much improved. The detector temperature of the 2 mum thermometer should be cooled down to -15degC to obtain a good signal to noise ratio at the indium point. These thermometers can be used as standard thermometers from 150degC to 1100degC for 1.6 mum and from 100degC to 660degC for 2 mum, respectively.
Keywords
III-V semiconductors; gallium arsenide; indium compounds; radiation detection; thermometers; Chino; NMIJ; radiation thermometers; ray trace method; signal to noise ratio; size of source effect; Calibration; Indium gallium arsenide; Lenses; Optical design; Photonics; Radiation detectors; Size measurement; Temperature distribution; Temperature measurement; Wavelength measurement; InGaAs; fixed point calibration; radiation thermometer; size of source effect; temperature effect;
fLanguage
English
Publisher
ieee
Conference_Titel
SICE Annual Conference, 2008
Conference_Location
Tokyo
Print_ISBN
978-4-907764-30-2
Electronic_ISBN
978-4-907764-29-6
Type
conf
DOI
10.1109/SICE.2008.4654920
Filename
4654920
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