DocumentCode :
3156286
Title :
The application of the virtual instrument technology in high voltage measuring system
Author :
Zang, Chunyan ; Wen, Yuanfang ; Wu, Hao
Author_Institution :
Coll. of Electr. & Electron. Eng., Huazhong Univ. of Sci. & Technol., Wuhan, China
Volume :
3
fYear :
2002
fDate :
6-10 Oct. 2002
Firstpage :
2300
Abstract :
The traditional way of high voltage (HV) measuring has some intrinsic shortcomings. With the recent improvement in digital measuring techniques and computers, digital automated measuring are become more prevalent. The virtual instrument (VI), which is a new technology in signal detecting, analyzing and processing, has been the authors´ main focus. This paper introduces the concept and characters of VI, its three main types and presents a PC-based VI to measure 8/20 μs impulse current. The VI is implemented in the two ways: the popular object-oriented programming language-Visual C++, and the famous graphical programming environment-LabVIEW. Signals are processed with the digital filter, smoothing window and fast Fourier transformation (FFT). Wave parameters can be calculated quickly and shown in the soft front panel. It can also be used to measure other high voltage waves after changed a little.
Keywords :
fast Fourier transforms; microcomputer applications; object-oriented programming; signal processing; virtual instrumentation; visual languages; 8 to 20 mus; LabVIEW; Visual C++; fast Fourier transform; graphical programming environment; high voltage measuring system; objected-oriented programming language; virtual instrument technology; wave parameters; Application software; Current measurement; Digital filters; Instruments; Object oriented programming; Signal analysis; Signal detection; Signal processing; Smoothing methods; Voltage measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Transmission and Distribution Conference and Exhibition 2002: Asia Pacific. IEEE/PES
Print_ISBN :
0-7803-7525-4
Type :
conf
DOI :
10.1109/TDC.2002.1177823
Filename :
1177823
Link To Document :
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