DocumentCode :
3156440
Title :
Low-Frequency Noise Measurements of Bipolar Devices Under High DC Current Density: Whether Transimpedance or Voltage Amplifiers
Author :
De Souza, A. A Lisboa ; Nallatamby, J.-C. ; Prigent, M.
Author_Institution :
Dep. C2S2, UMR CNRS, Brive
fYear :
2006
fDate :
10-13 Sept. 2006
Firstpage :
114
Lastpage :
117
Abstract :
Different setups for the measurement of the low-frequency noise of semiconductor devices have been proposed in the literature, based on the use of either low-noise voltage amplifiers (VAs) or, more recently, transimpedance amplifiers (TAs). This paper aims to address the applicability and physical limit of each configuration, when they are applied to measure the LF noise of HBTs or diodes at moderate to high DC current densities. Extracted noise curves issued from different setups are analyzed. Noise data collected from recent low-noise technologies shows that physical limits are being systematically approached
Keywords :
current density; low noise amplifiers; noise measurement; semiconductor device noise; bipolar devices; heterojunction bipolar transistor; high DC current density; low-frequency noise measurements; semiconductor device modeling; transimpedance amplifiers; voltage amplifiers; Current density; Current measurement; Density measurement; Low-frequency noise; Low-noise amplifiers; Noise measurement; Semiconductor device measurement; Semiconductor device noise; Semiconductor optical amplifiers; Voltage; Noise measurement; heterojunction bipolar transistor; semiconductor device modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
European Microwave Integrated Circuits Conference, 2006. The 1st
Conference_Location :
Manchester
Print_ISBN :
2-9600551-8-7
Type :
conf
DOI :
10.1109/EMICC.2006.282764
Filename :
4057587
Link To Document :
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