• DocumentCode
    3156470
  • Title

    QTL Mapping for Controlling Days to Pollen Shed under Different Nitrogen Regimes in Maize

  • Author

    Liu, Xiaohong ; Zhang, Yongsi ; Zheng, Zuping ; Li, Zhong ; He, Chuan ; Liu, Daihui ; Zhang, Guoqing ; Luo, Yangchun ; Tan, Zhenbo

  • Author_Institution
    Coll. of Life Sci., China West Normal Univ., Nanchong, China
  • fYear
    2010
  • fDate
    18-20 June 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Nitrogen (N) deficiency affects severely many metabolic pathways and physiological progresses during maize (Zea mays L.) growing stage, and change of days to pollen shed (DPS) is one of the most serious consequences. To realize the genetic basis of DPS, a recombinant inbred line (RIL) population from the cross between Mo17 and Huangzao4 was used to identify the quantitative trait loci (QTLs) controlling DPS under two N regimes. As a result, 2 QTLs were detected, of which the QTL identified under both N regimes was quite near to the marker Nc134, with 0 centiMorgan (cM) of mapping distance between them, it could account for 15.36% and 10.39% of phenotypic variance under high and low N regimes respectively, and could make maize flower with ahead of time about 1 d duo to its additive effect. The other QTL, identified only under low N regime, was close to marker Bnlg1129 with 8.6 cM of maping distance between them, could explain 12.39% of phenotypic variance and increase DPS for 0.8 d owing to its additive effect. These results are beneficial for understanding the genetic basis of DPS in maize.
  • Keywords
    agriculture; fertilisers; nitrogen; QTL mapping; Zea mays L; maize; nitrogen deficiency; quantitative trait locus; Additives; Biological cells; Biotechnology; Chromosome mapping; Cities and towns; Gene expression; Genetics; Helium; Nitrogen; Stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Bioinformatics and Biomedical Engineering (iCBBE), 2010 4th International Conference on
  • Conference_Location
    Chengdu
  • ISSN
    2151-7614
  • Print_ISBN
    978-1-4244-4712-1
  • Electronic_ISBN
    2151-7614
  • Type

    conf

  • DOI
    10.1109/ICBBE.2010.5518247
  • Filename
    5518247