DocumentCode :
315674
Title :
A simulation environment for pipelined analog-to-digital converters
Author :
Navin, Venkata K. ; Ray, Tapas ; Hassoun, Marwan M. ; Black, Willia C. ; Lee, Edward K F ; Soenen, Eric G. ; Geiger, Randall L.
Author_Institution :
Dallas Semicond., TX, USA
Volume :
3
fYear :
1997
fDate :
9-12 Jun 1997
Firstpage :
1620
Abstract :
This paper describes a detailed functional simulator for the design and characterization of single and parallel pipelined analog-to-digital converters. It is a user-friendly program which allows the user to specify the A/D parameters and thus target a particular architecture. Since high resolution is achieved by error correction algorithms, digital self-calibration is also incorporated. Modular design allows the user to replace any component model with more complex modules as demanded by the application. The environment also has the capability to perform single and double tone testing to determine the spurious free dynamic range of the ADC being considered. Since simulation of architectures at the functional level is fast and easy as opposed to a generalized mathematical package, the design cycle time is reduced considerably
Keywords :
analogue-digital conversion; calibration; circuit analysis computing; error correction; pipeline processing; A/D parameters specification; ADC characterization; analog-to-digital converters; architecture simulation; digital self-calibration; double tone testing; error correction algorithms; functional simulator; high resolution; modular design; pipelined ADCs; simulation environment; single tone testing; spurious free dynamic range; user-friendly program; Analog-digital conversion; Digital-analog conversion; Flowcharts; Linearity; Noise level; Nonlinear equations; Pipelines; Signal restoration; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 1997. ISCAS '97., Proceedings of 1997 IEEE International Symposium on
Print_ISBN :
0-7803-3583-X
Type :
conf
DOI :
10.1109/ISCAS.1997.621442
Filename :
621442
Link To Document :
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