Title :
Silicon-based PIN SPST RF switches for improved linearity
Author :
Sun, Pinping ; Liu, Peng ; Upadhyaya, Parag ; Jeong, DongHo ; Heo, Deukhyoun ; Mina, Essam
Author_Institution :
IBM Microelectronics, USA
Abstract :
Analysis of PIN diode´s geometric effects on the performance of RF switches is presented with measured data. The impact of periphery-to-area ratio (P/A) is investigated in terms of forward bias resistance and linearity. Theoretical analysis shows the smaller periphery-to-area ratio of PIN diode can reduce not only the forward biased resistance, but also the power handling capability. In addition, positive bias to the PIN diode´s cathode terminal can reduce the effects of Psub-Nwell parasitic diodes, leading to enhanced linearity. Fabricated in a standard 0.18-µm SiGe BiCMOS technology, the 50 µm2 PIN Single-pole-single-throw (SPST) RF switch MMIC can achieve an insertion loss of less than 0.69 dB from 2 to 18 GHz with the measured P1dB of 16 dBm.
Keywords :
Cathodes; Diodes; Electrical resistance measurement; Germanium silicon alloys; Linearity; Measurement standards; Performance analysis; Radio frequency; Silicon germanium; Switches;
Conference_Titel :
Microwave Symposium Digest (MTT), 2010 IEEE MTT-S International
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4244-6056-4
Electronic_ISBN :
0149-645X
DOI :
10.1109/MWSYM.2010.5518266