• DocumentCode
    3156921
  • Title

    A novel technology for the simultaneous diffusion of boron, aluminum and phosphorus in silicon [solar cells]

  • Author

    Krygowski, Thomas ; Sana, Peyman ; Crotty, Gerald ; Rohatgi, Ajeet

  • Author_Institution
    Univ. Center of Excellence for Photovoltaics Res. & Educ., Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    1996
  • fDate
    13-17 May 1996
  • Firstpage
    393
  • Lastpage
    396
  • Abstract
    A novel doping technique is presented to simultaneously diffuse boron, phosphorus and aluminum in Si solar cells in a single furnace step, without any detectable cross doping. This process also allows the growth of a passivating oxide in-situ, which is shown to be as good as a high quality re-grown thermal oxide. Three variations of this doping technique are presented to accommodate several solar cell designs, two of which involve the simultaneous diffusion of boron and phosphorus, while the third involves the simultaneous diffusion of aluminum and phosphorus in silicon. Initial results using boron and phosphorus gave a conversion efficiency of 19.3% on float zone silicon, 17.4% on Czochralski silicon, and 17.6% on multicrystalline silicon, while the aluminum and phosphorus process gave a conversion efficiency of 19% on float zone silicon
  • Keywords
    aluminium; boron; elemental semiconductors; passivation; phosphorus; semiconductor device testing; semiconductor doping; silicon; solar cells; 17.4 percent; 17.6 percent; 19 percent; 19.3 percent; Czochralski silicon; Si:Al,P; Si:B,P; doping technique; float zone silicon; multicrystalline silicon; passivating oxide growth; re-grown thermal oxide; simultaneous diffusion; single furnace step; solar cell doping; Aluminum; Boron; Crystalline materials; Doping; Fabrication; Furnaces; Photovoltaic cells; Silicon; Solids; Throughput;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 1996., Conference Record of the Twenty Fifth IEEE
  • Conference_Location
    Washington, DC
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-3166-4
  • Type

    conf

  • DOI
    10.1109/PVSC.1996.564026
  • Filename
    564026