Title :
Current trends and their impact on microcircuit quality assurance
Abstract :
This paper mentions some of the problems facing the industry as it attempts to move from one-micron devices to 0.1 micron size-from a million transistor VLSI to a 100-million transistor device. The 1990 International Reliability Physics Symposium presented a kaleidoscope of ideas and equipment developed to meet the challenges of the 1990s, some of which are described
Keywords :
VLSI; circuit reliability; integrated circuit testing; life testing; quality control; VLSI; accelerated stress testing; equipment; microcircuit quality assurance; reliability engineering; trends; Costs; Fabrication; Life estimation; Life testing; Manufacturing industries; Quality assurance; Semiconductor device modeling; Stress; Temperature; Very large scale integration;
Conference_Titel :
Electrical and Electronics Engineers in Israel, 1991. Proceedings., 17th Convention of
Conference_Location :
Tel Aviv
Print_ISBN :
0-87942-678-0
DOI :
10.1109/EEIS.1991.217661
