DocumentCode
3157910
Title
Current trends and their impact on microcircuit quality assurance
Author
Carmel, Paul
fYear
1991
fDate
5-7 Mar 1991
Firstpage
213
Lastpage
214
Abstract
This paper mentions some of the problems facing the industry as it attempts to move from one-micron devices to 0.1 micron size-from a million transistor VLSI to a 100-million transistor device. The 1990 International Reliability Physics Symposium presented a kaleidoscope of ideas and equipment developed to meet the challenges of the 1990s, some of which are described
Keywords
VLSI; circuit reliability; integrated circuit testing; life testing; quality control; VLSI; accelerated stress testing; equipment; microcircuit quality assurance; reliability engineering; trends; Costs; Fabrication; Life estimation; Life testing; Manufacturing industries; Quality assurance; Semiconductor device modeling; Stress; Temperature; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical and Electronics Engineers in Israel, 1991. Proceedings., 17th Convention of
Conference_Location
Tel Aviv
Print_ISBN
0-87942-678-0
Type
conf
DOI
10.1109/EEIS.1991.217661
Filename
217661
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