• DocumentCode
    3158336
  • Title

    Ultra-Wideband Shielded Vertical Via Transitions from DC up to the V-Band

  • Author

    Kangasvieri, T. ; Halme, J. ; Vahakangas, J. ; Lahti, M.

  • Author_Institution
    Microelectron. & Mater. Phys. Labs., Oulu Univ.
  • fYear
    2006
  • fDate
    10-13 Sept. 2006
  • Firstpage
    476
  • Lastpage
    479
  • Abstract
    This paper presents three shielded vertical via transition designs applicable in millimeter-wave module packaging from DC up to the F-band. The optimized transition structures were fabricated using a standard low-temperature co-fired ceramic (LTCC) process. The measured scattering parameter results of the back-to-back via transition structures showed an exceptionally wide bandwidth with return losses better than 18 dB up to 50 GHz. The extracted insertion loss values of the single transitions were less than about 0.4 dB at 50 GHz. Moreover, full-wave electromagnetic (EM) simulations demonstrated the high potential of two of these via transitions up to 70 GHz
  • Keywords
    S-parameters; UHF integrated circuits; ceramic packaging; microwave integrated circuits; millimetre wave integrated circuits; modules; waveguide transitions; LTCC process; back-to-back via transition structures; full-wave electromagnetic simulations; insertion loss; low-temperature co-fired ceramic; millimeter-wave module packaging; optimized transition structures; scattering parameter; ultra-wideband shielded vertical via transitions; Bandwidth; Ceramics; Feeds; Millimeter wave technology; Nonhomogeneous media; Packaging; Radio frequency; Scattering parameters; Testing; Ultra wideband technology; Low-loss; low-temperature co-fired ceramic (LTCC); transition; wideband;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    European Microwave Integrated Circuits Conference, 2006. The 1st
  • Conference_Location
    Manchester
  • Print_ISBN
    2-9600551-8-7
  • Type

    conf

  • DOI
    10.1109/EMICC.2006.282686
  • Filename
    4057680