• DocumentCode
    3158485
  • Title

    Detection and classification of voltage sag causes based on empirical mode decomposition

  • Author

    Manjula, M. ; Sarma, A.V.R.S. ; Mishra, Sukumar

  • Author_Institution
    Osmania Univ., Hyderabad, India
  • fYear
    2011
  • fDate
    16-18 Dec. 2011
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Voltage sag is one of the common cause for mal operation of most the equipment. This paper presents an algorithm to detect and classify voltage sag causes based on Empirical Mode Decomposition (EMD). EMD is a method which decomposes a non stationary signal into different mono component signals. These mono component signals are called Intrinsic Mode Functions (IMFs). The magnitude plot of the Hilbert Transform (HT) of the first IMF has the ability to detect the disturbance. The features of the first three IMFs of each disturbance are used as inputs to Probabilistic Neural Network (PNN) for identification of voltage sag causes. Three voltage sag causes are (i) Fault induced voltage sag (ii) Starting of induction motor and (iii) Three phase transformer energization. A comparison is made with wavelet transform. Simulation results show that the EMD method is more efficient in classifying the voltage sag causes.
  • Keywords
    Hilbert transforms; induction motors; neural nets; power engineering computing; power supply quality; power transformers; wavelet transforms; EMD method; HT; Hilbert transform; IMF; PNN; empirical mode decomposition; equipment maloperation; fault-induced voltage sag; intrinsic mode functions; monocomponent signals; nonstationary signal decomposition; probabilistic neural network; three-phase transformer energization; voltage sag classification; voltage sag detection; wavelet transform; Feature extraction; Induction motors; Power quality; Probabilistic logic; Voltage fluctuations; Wavelet transforms; Empirical mode decomposition; hilbert transform; intrinsic mode functions; probabilistic neural network; voltage sag causes; wavelet transform;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    India Conference (INDICON), 2011 Annual IEEE
  • Conference_Location
    Hyderabad
  • Print_ISBN
    978-1-4577-1110-7
  • Type

    conf

  • DOI
    10.1109/INDCON.2011.6139581
  • Filename
    6139581