• DocumentCode
    3158502
  • Title

    Background noise estimation using outer product expansion for ELF electromagnetic wave signal

  • Author

    Itai, Akitoshi ; Yasukawa, Hiroshi ; Takumi, Ichi ; Hata, Masayasu

  • Author_Institution
    Aichi Prefectural Univ., Nagakute, Japan
  • fYear
    2009
  • fDate
    7-9 Jan. 2009
  • Firstpage
    131
  • Lastpage
    134
  • Abstract
    This paper shows the denoising performance of the outer product expansion with non-linear filters for the background noise included in the extremely low frequency (ELF) electromagnetic (EM) waves. We have proposed novel source separation techniques based on an outer product expansion with non-linear filters. Some kinds of the algorithm for the outer product expansion and its effectiveness have been reported. However, the denoising accuracy for real data has not been shown in the conventional researches. In this paper, two algorithms for an outer product expansion are applied to conduct the suitable method for the background noise reduction problem of EM wave data. Two topics are discussed in this paper. The performance of background noise reductions for ELF EM data analysis is represented using an outer product expansion. Moreover, optimal parameters, which yields the accurate denoising for EM wave data, are introduced.
  • Keywords
    electromagnetic waves; nonlinear filters; signal denoising; source separation; ELF EM data analysis; ELF electromagnetic wave signal; background noise estimation; background noise reduction; denoising performance; extremely low frequency electromagnetic waves; nonlinear filter; outer product expansion; source separation; Background noise; Electromagnetic scattering; Electronic mail; Filters; Frequency estimation; Geophysical measurement techniques; Ground penetrating radar; Noise reduction; Signal processing; Tensile stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Signal Processing and Communication Systems, 2009. ISPACS 2009. International Symposium on
  • Conference_Location
    Kanazawa
  • Print_ISBN
    978-1-4244-5015-2
  • Electronic_ISBN
    978-1-4244-5016-9
  • Type

    conf

  • DOI
    10.1109/ISPACS.2009.5383883
  • Filename
    5383883