Title :
Auto defect repair algorithm for LCD panel review & repair machine
Author :
Chul, Lee Woo ; Bong, Song Jun ; Yeol, Kim Byung ; Hyuk, Park Sang ; Muk, Lim Sung ; Won Jeong, Lee
Author_Institution :
Manuf. Autom. Group, LG Electron. Inc., Anyang
Abstract :
In TFT-LCD manufacturing process, various defects are generated by manufacturing machine trouble or particle. These defects can be repaired through the TFT-laser repair process that only canpsilat be automated in TFT-LCD manufacturing process. In this paper, we propose auto defect algorithm for TFT-LCD laser repair machine using image processing algorithm in order to automate process. Proposed algorithm can detect very small defects (under 2 um) in 98% success ratio, and generated laser repair path guarantee highly precise position accuracy. Through proposed system, much of the work still done the old-fashioned way, by hand, can be automated and manufacturing company can be strengthen the competitiveness of cost.
Keywords :
image processing; liquid crystal displays; production engineering computing; LCD panel review; TFT-LCD manufacturing process; TFT-laser repair process; auto defect repair algorithm; image processing algorithm; manufacturing machine; repair machine; Colored noise; Costs; Data mining; Detection algorithms; Image processing; Laser noise; Low pass filters; Manufacturing automation; Manufacturing processes; Microscopy; Auto Defect Repair; Auto Repair; Defect Detection; Laser Repair; Path Generation; TFT-LCD Repair;
Conference_Titel :
SICE Annual Conference, 2008
Conference_Location :
Tokyo
Print_ISBN :
978-4-907764-30-2
Electronic_ISBN :
978-4-907764-29-6
DOI :
10.1109/SICE.2008.4655029
