• DocumentCode
    3158784
  • Title

    Simple approximations for degenerate non-parabolic semiconductors

  • Author

    Altschul, V. ; Bahir, G. ; Finkman, E.

  • Author_Institution
    Dept. of Electr. Eng., Technion-Israel Inst. of Technol., Haifa, Israel
  • fYear
    1991
  • fDate
    5-7 Mar 1991
  • Firstpage
    79
  • Lastpage
    82
  • Abstract
    The authors propose simple, explicit expressions that describe properties of semiconductor devices with nonparabolic energy bands. The new model includes effects of carrier degeneracy and impurity freeze-out. The approach is based on a recently proposed approximation for the semiconductor statistics derived from Kane´s k· p model. The authors use that approximation to calculate intrinsic properties of semiconductors, n·p product, and the Einstein relation. They then solve a one-dimensional Poisson´s equation and obtain a relationship between the total semiconductor charge and the surface potential. This method can be applied to heterojunction and field effect devices with wide and narrow band gaps. They use the new approach to calculate the incremental capacitance of an MIS structure and compare the results with an accurate numerical model and experimental measurements of an HgCdTe capacitor
  • Keywords
    II-VI semiconductors; cadmium compounds; capacitors; degenerate semiconductors; field effect devices; impurity electron states; k.p calculations; mercury compounds; narrow band gap semiconductors; semiconductor device models; surface potential; Einstein relation; HgCdTe; HgCdTe capacitor; Kane´s k·p model; MIS structure; carrier degeneracy; degenerate semiconductors; explicit expressions; field effect devices; heterojunction devices; impurity freeze-out; incremental capacitance; intrinsic properties; n·p product; nonparabolic energy bands; nonparabolic semiconductors; one-dimensional Poisson´s equation; semiconductor devices; semiconductor statistics approximation; surface potential; total semiconductor charge; Capacitors; Cities and towns; Electrons; Narrowband; Numerical models; Photonic band gap; Semiconductor devices; Semiconductor impurities; Semiconductor materials; Statistics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical and Electronics Engineers in Israel, 1991. Proceedings., 17th Convention of
  • Conference_Location
    Tel Aviv
  • Print_ISBN
    0-87942-678-0
  • Type

    conf

  • DOI
    10.1109/EEIS.1991.217707
  • Filename
    217707