DocumentCode
3158784
Title
Simple approximations for degenerate non-parabolic semiconductors
Author
Altschul, V. ; Bahir, G. ; Finkman, E.
Author_Institution
Dept. of Electr. Eng., Technion-Israel Inst. of Technol., Haifa, Israel
fYear
1991
fDate
5-7 Mar 1991
Firstpage
79
Lastpage
82
Abstract
The authors propose simple, explicit expressions that describe properties of semiconductor devices with nonparabolic energy bands. The new model includes effects of carrier degeneracy and impurity freeze-out. The approach is based on a recently proposed approximation for the semiconductor statistics derived from Kane´s k · p model. The authors use that approximation to calculate intrinsic properties of semiconductors, n ·p product, and the Einstein relation. They then solve a one-dimensional Poisson´s equation and obtain a relationship between the total semiconductor charge and the surface potential. This method can be applied to heterojunction and field effect devices with wide and narrow band gaps. They use the new approach to calculate the incremental capacitance of an MIS structure and compare the results with an accurate numerical model and experimental measurements of an HgCdTe capacitor
Keywords
II-VI semiconductors; cadmium compounds; capacitors; degenerate semiconductors; field effect devices; impurity electron states; k.p calculations; mercury compounds; narrow band gap semiconductors; semiconductor device models; surface potential; Einstein relation; HgCdTe; HgCdTe capacitor; Kane´s k·p model; MIS structure; carrier degeneracy; degenerate semiconductors; explicit expressions; field effect devices; heterojunction devices; impurity freeze-out; incremental capacitance; intrinsic properties; n·p product; nonparabolic energy bands; nonparabolic semiconductors; one-dimensional Poisson´s equation; semiconductor devices; semiconductor statistics approximation; surface potential; total semiconductor charge; Capacitors; Cities and towns; Electrons; Narrowband; Numerical models; Photonic band gap; Semiconductor devices; Semiconductor impurities; Semiconductor materials; Statistics;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical and Electronics Engineers in Israel, 1991. Proceedings., 17th Convention of
Conference_Location
Tel Aviv
Print_ISBN
0-87942-678-0
Type
conf
DOI
10.1109/EEIS.1991.217707
Filename
217707
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