• DocumentCode
    3159043
  • Title

    Modeling relativistic electron beams with finite-element ray-tracing codes

  • Author

    Humphries, S., Jr. ; Petillo, J.

  • Author_Institution
    Field Precision, Albuquerque, NM, USA
  • Volume
    4
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    2737
  • Abstract
    Ray-tracing codes determine self-consistent electric fields in high-current electron devices by an iterative procedure of orbit tracking and space-charge deposition with field recalculation. Methods to find beam-generated magnetic fields for relativistic beams are less standardized. Existing approaches (like ray counting or the relativistic transverse force approximation) have limited accuracy and do not include effects of current flow in source and collector electrodes. We describe a new method for two-dimensional finite-element codes where the beam current is deposited on the faces of the conformal elements of the electrostatic mesh. The resulting balanced calculations of electric and magnetic forces are resistant to numerical filamentation instabilities. With simple rules it is possible to assign boundary currents even in complex structures
  • Keywords
    electron guns; finite element analysis; numerical stability; relativistic electron beams; beam-generated magnetic fields; field recalculation; finite-element ray-tracing codes; high-current electron devices; iterative procedure; numerical filamentation instabilities; orbit tracking; ray counting; relativistic beams; relativistic electron beams; relativistic transverse force approximation; self-consistent electric fields; space-charge deposition; two-dimensional finite-element codes; Electrodes; Electron beams; Electron devices; Electrostatics; Face detection; Finite element methods; Laboratories; Magnetic fields; Orbital calculations; Ray tracing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Particle Accelerator Conference, 1999. Proceedings of the 1999
  • Conference_Location
    New York, NY
  • Print_ISBN
    0-7803-5573-3
  • Type

    conf

  • DOI
    10.1109/PAC.1999.792921
  • Filename
    792921