Title :
A built-in rule scan structure for analog fuzzy processors test and fault diagnosis
Author :
Bellini, A. ; Rovatti, R. ; Franchi, E. ; Baccarani, G.
Author_Institution :
Bologna Univ., Italy
Abstract :
In this paper a novel methodology for testing dedicated analog fuzzy processors is presented. It relies on small additional hardware, and features independence from the actual input-output relationship of the processor and low time for the test scan. In fact validation time does not increase exponentially with the number of inputs, as it would with an exhaustive sampling of the input-output relationship. Some simulation results show that all the most likely faults are detected
Keywords :
built-in self test; design for testability; fault diagnosis; fuzzy logic; fuzzy neural nets; fuzzy systems; analog fuzzy processors; built-in rule scan structure; exhaustive sampling; fault diagnosis; input-output relationship; simulation results; test diagnosis; test scan; Analog circuits; Circuit synthesis; Circuit testing; Computer architecture; Design for testability; Fault diagnosis; Hardware; Logic testing; Microelectronics; Software tools;
Conference_Titel :
Fuzzy Systems, 1997., Proceedings of the Sixth IEEE International Conference on
Conference_Location :
Barcelona
Print_ISBN :
0-7803-3796-4
DOI :
10.1109/FUZZY.1997.622808
