Experimental and analytic studies of an RF load resistor

Author

Borovina, D.L. ; Gahl, J.M. ; Humphries, S., Jr. ; Rees, D. ; Toole, L.

Author_Institution

New Mexico Univ., Albuquerque, NM, USA

Volume

4

fYear

1999

fDate

1999

Firstpage

2772

Abstract

The pulsed output of an 850-MHz klystron was directed into a load assembly containing a water-cooled, 50-ohm resistor. The load was systematically subjected to high peak-power pulses from the klystron. Several thin-film resistors were tested and exhibited various damage patterns for different combinations of peak microwave power (33 kW-500 kW) and heat input. In order to better understand the phenomena observed, the electromagnetic field distribution inside the resistor housing was studied with WaveSim, a two-dimensional, finite-element scattering code. The conformal mesh of the program allowed accurate representations of the complex assembly geometry

Keywords

accelerator RF systems; klystrons; thin film resistors; 33 to 500 kW; RF load resistor; WaveSim; complex assembly geometry; conformal mesh; damage patterns; electromagnetic field distribution; klystron; peak microwave power; resistor housing; thin-film resistors; two-dimensional finite-element scattering code; Assembly; Cogeneration; Electromagnetic fields; Electromagnetic heating; Finite element methods; Klystrons; Radio frequency; Resistors; Testing; Transistors;

fLanguage

English

Publisher

ieee

Conference_Titel

Particle Accelerator Conference, 1999. Proceedings of the 1999

Conference_Location

New York, NY

Print_ISBN

0-7803-5573-3

Type

conf

DOI

10.1109/PAC.1999.792933

Filename

792933