Title :
A/D converter using Iterative Divide-by-Two Reference for CMOS image sensor
Author :
Lee, Jeonghwan ; Han, Gunhee
Author_Institution :
Dept. of Electr. & Electron. Eng., Yonsei Univ., Seoul
Abstract :
This paper proposes an ADC using Iterative Divide-by-Two Reference. Using and sharing a single voltage divider reduces silicon area for a column compared with the conventional SA-ADC. An offset-cancelled integrator and a capacitor error averaging method are implemented to decrease the impact of nonlinearities. The ADC is designed in 0.18-mum CMOS process and consumes 0.35-mW of power per ADC, and the active die area is 0.012-mm2.
Keywords :
CMOS image sensors; analogue-digital conversion; voltage dividers; A/D converter; CMOS image sensor; capacitor error averaging method; iterative divide-by-two reference; offset-cancelled integrator; power 0.35 mW; voltage divider; CMOS image sensors; Capacitors; Computational Intelligence Society; Energy consumption; Image converters; Image sensors; Registers; Sensor arrays; Silicon; Voltage; CIS; SA-ADC; column-parallel ADC; component;
Conference_Titel :
SoC Design Conference, 2008. ISOCC '08. International
Conference_Location :
Busan
Print_ISBN :
978-1-4244-2598-3
Electronic_ISBN :
978-1-4244-2599-0
DOI :
10.1109/SOCDC.2008.4815737
