A Method for Device Intermodulation Analysis from 2D, TCAD Simulations using a Time-domain Waveform Approach

This paper describes a fast method useful for IMD analysis at TCAD design level. The method is based on the static load-line transfer function extracted from 2D device simulations. The transfer function is exposed to a time domain signal through a look-up table and the output response is analyzed using the fast Fourier transform. The response is compared to measurements of a fabricated device. The method is shown to accurately predict the IMD behavior of a two-tone signal for the 3´rd, 5´th and 7´th order IMD products with regards to sweet spot tracking and relative IMD magnitude. The paper presents a fast and simple way to predict IMD performance from TCAD simulations at an early stage in the design process. The method enables prediction of output response from any signal due to the time domain approach