DocumentCode :
3160945
Title :
Dependence of cell performance on wafer thickness for BSF and non-BSF cells
Author :
Koval, T. ; Wohlgemuth, J. ; Kinsey, B.
Author_Institution :
Solarex Corp., Frederick, MD, USA
fYear :
1996
fDate :
13-17 May 1996
Firstpage :
505
Lastpage :
507
Abstract :
This paper reports on the results of a set of experiments designed to study the relationship between cell thickness and efficiency for cast polycrystalline silicon solar cells. Cells without back surface field are less efficient as they get thinner. Short circuit current, open circuit voltage and fill factor all decrease as the non-BSF cells get thinner. However, cells made with an aluminum paste back surface field show the opposite relationship; thinner cells are more efficient. This higher efficiency for thinner BSF cells is the result of higher short circuit current and higher fill factor. The physics behind these results are discussed
Keywords :
aluminium; elemental semiconductors; semiconductor device metallisation; short-circuit currents; silicon; solar cells; 200 to 300 mum; Al; Al paste; BSF cells; Si; Si-Al; aluminum paste back surface field; back surface field; cast polycrystalline silicon solar cells; cell performance; efficiency; fill factor; non-BSF cells; open circuit voltage; short circuit current; thinner cells; wafer thickness; Artificial intelligence; Computational geometry; Firing; Short circuit currents; Solid modeling; Surface fitting; Surface waves; Thickness measurement; Voltage; Wavelength measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 1996., Conference Record of the Twenty Fifth IEEE
Conference_Location :
Washington, DC
ISSN :
0160-8371
Print_ISBN :
0-7803-3166-4
Type :
conf
DOI :
10.1109/PVSC.1996.564054
Filename :
564054
Link To Document :
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