DocumentCode
3161027
Title
Bruegel´s drawings under the multifractal microscope
Author
Abry, P. ; Jaffard, S. ; Wendt, H.
Author_Institution
Phys. Dept., ENS Lyon, Lyon, France
fYear
2012
fDate
25-30 March 2012
Firstpage
3909
Lastpage
3912
Abstract
Recently, a growing interest in the exploration of the potential of signal or image processing tools for the purposes of art analysis has emerged. The wavelet leader based multifractal analysis consists of a mathematical tool recently introduced in image processing for the characterization of homogeneous textures based on their regularity properties. Here, this novel tool is applied to a set of digitized versions of drawings, made available by the NY Metropolitan Museum of Art, consisting of authentic Bruegel drawings and several imitations. Multifractal attributes are estimated from several patches of each of these drawings, and their ability to discriminate authentic drawings from impostors is investigated by means of subspace projections and quadratic discriminant analysis. Besides showing very satisfactory performance, the achieved discrimination provides interesting insights into the differences between the regularity of the textures of authentic Bruegel drawings versus imitations, potentially relating the fractal properties of the drawings to the artist´s drawing style.
Keywords
image texture; museums; wavelet transforms; NY Metropolitan Museum of Art; artist drawing style; authentic Bruegel drawing texture; discriminate authentic drawings; drawing fractal properties; homogeneous texture characterization; image processing tools; mathematical tool; multifractal microscope; quadratic discriminant analysis; signal processing tools; subspace projections; wavelet leader based multifractal analysis; Art; Forgery; Fractals; Image processing; Signal processing; Wavelet analysis; Wavelet transforms; Bruegel´s Drawings; Forgery Detection; Multifractal Analysis; Texture Analysis; Wavelet Leaders;
fLanguage
English
Publisher
ieee
Conference_Titel
Acoustics, Speech and Signal Processing (ICASSP), 2012 IEEE International Conference on
Conference_Location
Kyoto
ISSN
1520-6149
Print_ISBN
978-1-4673-0045-2
Electronic_ISBN
1520-6149
Type
conf
DOI
10.1109/ICASSP.2012.6288772
Filename
6288772
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