DocumentCode
3161357
Title
A design and manufacturing solution for high-reliable, non-leaded CSPs like QFN
Author
Kuhnlein, Gerd
Author_Institution
ESEC SA, Cham, Switzerland
fYear
2001
fDate
2001
Firstpage
47
Lastpage
53
Abstract
One of the new extremely miniaturized IC-packages, first presented by Matsushita under the designation QFN, has rapidly become popular with fast growing numbers. One concern is the limited device reliability, which requires improvements aimed from the main market like telecommunication and automotive electronic manufacturers. By carefully analyzing all the constraints which limits the device- and board assembly quality of such new devices by using all the experiences from the past and by taking in consideration the capabilities of existing and well established assembly and packaging technologies, it should be possible to build and economically manufacture such devices in high volume, achieving the required board assembly quality and device reliability in the requested cost frame
Keywords
chip scale packaging; reliability; CSP; IC package; QFN; design; manufacture; reliability; Assembly; Electronic equipment manufacture; Electronics packaging; Lead; Manufacturing processes; Packaging machines; Pins; Process design; Pulp manufacturing; Semiconductor device manufacture;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2001. Proceedings., 51st
Conference_Location
Orlando, FL
ISSN
0569-5503
Print_ISBN
0-7803-7038-4
Type
conf
DOI
10.1109/ECTC.2001.927683
Filename
927683
Link To Document