• DocumentCode
    3161357
  • Title

    A design and manufacturing solution for high-reliable, non-leaded CSPs like QFN

  • Author

    Kuhnlein, Gerd

  • Author_Institution
    ESEC SA, Cham, Switzerland
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    47
  • Lastpage
    53
  • Abstract
    One of the new extremely miniaturized IC-packages, first presented by Matsushita under the designation QFN, has rapidly become popular with fast growing numbers. One concern is the limited device reliability, which requires improvements aimed from the main market like telecommunication and automotive electronic manufacturers. By carefully analyzing all the constraints which limits the device- and board assembly quality of such new devices by using all the experiences from the past and by taking in consideration the capabilities of existing and well established assembly and packaging technologies, it should be possible to build and economically manufacture such devices in high volume, achieving the required board assembly quality and device reliability in the requested cost frame
  • Keywords
    chip scale packaging; reliability; CSP; IC package; QFN; design; manufacture; reliability; Assembly; Electronic equipment manufacture; Electronics packaging; Lead; Manufacturing processes; Packaging machines; Pins; Process design; Pulp manufacturing; Semiconductor device manufacture;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2001. Proceedings., 51st
  • Conference_Location
    Orlando, FL
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-7038-4
  • Type

    conf

  • DOI
    10.1109/ECTC.2001.927683
  • Filename
    927683