• DocumentCode
    3161375
  • Title

    Wide area vertical expansion (WAVETM) package design for high speed application: reliability and performance

  • Author

    Kim, Young-Gon ; Mohammed, Ilyas ; Seol, Byong-Su Brian ; Kang, Teck-Gyu

  • Author_Institution
    Tessera Inc., San Jose, CA, USA
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    54
  • Lastpage
    62
  • Abstract
    A two metal flex-based WAVE package has been developed to replace four metal rigid based PBGA package. High board-level reliability was the primary motivation for this project and an equivalent electrical performance was a challenging target. All the package dimensions were maintained the same as the reference package to allow direct replacement. As a result of the one-year-long development program, the required reliability and performance goals were met successfully. This paper mainly describes the WAVE package design for reliability and performance. Optimal lead design is the most important step for reliable package development. The WAVE geometry model (WAVEGM) was developed to analyze the lead type, lead orientation, bump height, and injection lift height. The 2-metal flex tape was chosen to replace the original 4-metal rigid substrate due to its thinner dielectric layer, lower dielectric constant and improved trace/space design capability. The electrical performance was verified by both simulation and actual measurements of a test device
  • Keywords
    packaging; reliability; WAVE; WAVE geometry model; compliant electronic package; dielectric constant; dielectric layer; electrical characteristics; high-speed device; lead design optimization; reliability; trace/space design; two-metal flex tape; wide area vertical expansion package; Electronic components; Electronics packaging; Joining materials; Lead; Manufacturing processes; Microassembly; Polyimides; Space technology; Testing; Vehicles;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2001. Proceedings., 51st
  • Conference_Location
    Orlando, FL
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-7038-4
  • Type

    conf

  • DOI
    10.1109/ECTC.2001.927684
  • Filename
    927684