DocumentCode :
3161403
Title :
Six-port Complex Permittivity Measurements
Author :
de Souza Rolim, A.L. ; De Oliveira, A. J Belfort ; de Melo, M.T.
Author_Institution :
Departamento de Eletronica e Sistemas, Univ. Fed. de Pernambuco, Recife
fYear :
2006
fDate :
10-15 Sept. 2006
Firstpage :
492
Lastpage :
494
Abstract :
This paper describes a new method of measuring the complex relative permittivity epsiv* of high-loss and low-loss materials up to the L-band in the microwave range, based on the six-port technique. The novel feature of this method is the determination of epsiv* directly from the intersection of three circles in the complex epsiv*-plane. This implies that neither liquids nor granulated materials are used as calibration standards; instead, conventional loads are employed. Furthermore, the ambiguity usually found in the phase of S21 and reported in several methods is completely eliminated by the already consolidated six-port technique. Measured results are here presented for a high-loss material
Keywords :
calibration; dielectric losses; dielectric materials; microwave measurement; permittivity measurement; standards; L-band; calibration standard; complex relative permittivity; directional coupler; granulated material; high-loss material; liquid material; low-loss material; materials testing; microwave materials; reflectometry; six-port complex permittivity measurement; Calibration; Coaxial components; Liquids; Materials testing; Microwave measurements; Microwave theory and techniques; Permittivity measurement; Phase measurement; Scattering parameters; Strontium; Calibration; directional couplers; materials testing; permittivity measurement; reflectometry;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 2006. 36th European
Conference_Location :
Manchester
Print_ISBN :
2-9600551-6-0
Type :
conf
DOI :
10.1109/EUMC.2006.281417
Filename :
4057858
Link To Document :
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