• DocumentCode
    3161403
  • Title

    Six-port Complex Permittivity Measurements

  • Author

    de Souza Rolim, A.L. ; De Oliveira, A. J Belfort ; de Melo, M.T.

  • Author_Institution
    Departamento de Eletronica e Sistemas, Univ. Fed. de Pernambuco, Recife
  • fYear
    2006
  • fDate
    10-15 Sept. 2006
  • Firstpage
    492
  • Lastpage
    494
  • Abstract
    This paper describes a new method of measuring the complex relative permittivity epsiv* of high-loss and low-loss materials up to the L-band in the microwave range, based on the six-port technique. The novel feature of this method is the determination of epsiv* directly from the intersection of three circles in the complex epsiv*-plane. This implies that neither liquids nor granulated materials are used as calibration standards; instead, conventional loads are employed. Furthermore, the ambiguity usually found in the phase of S21 and reported in several methods is completely eliminated by the already consolidated six-port technique. Measured results are here presented for a high-loss material
  • Keywords
    calibration; dielectric losses; dielectric materials; microwave measurement; permittivity measurement; standards; L-band; calibration standard; complex relative permittivity; directional coupler; granulated material; high-loss material; liquid material; low-loss material; materials testing; microwave materials; reflectometry; six-port complex permittivity measurement; Calibration; Coaxial components; Liquids; Materials testing; Microwave measurements; Microwave theory and techniques; Permittivity measurement; Phase measurement; Scattering parameters; Strontium; Calibration; directional couplers; materials testing; permittivity measurement; reflectometry;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 2006. 36th European
  • Conference_Location
    Manchester
  • Print_ISBN
    2-9600551-6-0
  • Type

    conf

  • DOI
    10.1109/EUMC.2006.281417
  • Filename
    4057858