DocumentCode :
3161502
Title :
Accelerated Moisture Sensitivity Test Methodology for Stacked-Die Molded Matrix Array Package
Author :
Xie, Bin ; Shi, Xunqing ; Fan, Xuejun
Author_Institution :
Shanghai Jiao Tong Univ., Shanghai
fYear :
2007
fDate :
10-12 Dec. 2007
Firstpage :
100
Lastpage :
104
Abstract :
The existing IPC/JEDEC of moisture/reflow sensitivity classification determines the time of accelerated equivalent soak by the equivalency of moisture concentration at the critical interface with the standard sensitivity test. This paper proposes a new methodology of accelerated moisture sensitivity test based on the equivalency of both local moisture concentration and overall moisture distribution for stacked-die molded matrix array package (MMAP). The new methodology can ensure the same failure rate of cracking/delamination by the equivalency of local vapor pressure, interfacial adhesion as well as the thermo- and hygro-stresses. Finite element analysis (FEA) is applied for moisture diffusion and vapor pressure analysis under the conditions of 30degC/60%RH and 60degC/60%RH, respectively. At 70 hours at 60degC/60%RH, both the local moisture concentration at critical interface and overall moisture distribution of package become identical with that at 216 at 30degC/60%RH, indicating that 70 hours is the equivalent soak time compared to the standard MSL-3 for this type of MMAP packages. Such an equivalency of the new accelerated test conditions is proven by moisture/reflow experiments under various soak times at 30degC/60%RH and 60degC/60%RH. Damage response assessed from inspection for internal cracking/delamination indicates that the accelerated test procedures are well correlated and considered indistinguishable in terms of failure rate.
Keywords :
cracks; delamination; finite element analysis; integrated circuit packaging; microassembling; moisture measurement; FEA; IPC-JEDEC; accelerated moisture sensitivity test methodology; cracking; delamination; finite element analysis; hygro-stresses; interfacial adhesion; microelectronic packaging; moisture diffusion; moisture-reflow sensitivity classification; stacked-die molded matrix array package; temperature 30 degC; temperature 60 degC; thermo-stresses; time 70 hour; vapor pressure analysis; Adhesives; Delamination; Electronic equipment testing; Electronic packaging thermal management; Humidity; Life estimation; Moisture; Plastics; Temperature sensors; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Packaging Technology Conference, 2007. EPTC 2007. 9th
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-1323-2
Electronic_ISBN :
978-1-4244-1323-2
Type :
conf
DOI :
10.1109/EPTC.2007.4469765
Filename :
4469765
Link To Document :
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