Optimization of integrated circuit design with respect to yield

Author

Athay, Robert N.

Author_Institution

Dept. of Syst. Eng., Virginia Univ., Charlottesville, VA, USA

Volume

1

fYear

1997

fDate

12-15 Oct 1997

Firstpage

433

Abstract

In general, product design can be viewed as an optimization problem, where the objective is some measure of performance or life cycle cost. An important feature of integrated circuit fabrication that has no apparent analog in other industries is the need to consider the net yield of the fabrication process during the design phase of product development. This paper discusses the problem of optimal circuit design with respect to yield, which has become an important application for nonlinear optimization techniques

Keywords

circuit optimisation; integrated circuit design; integrated circuit manufacture; integrated circuit yield; optimisation; product development; production control; IC manufacture; fabrication proces; integrated circuit design; life cycle cost; nonlinear optimization; optimization; product design; product development; production control; Analog integrated circuits; Cost function; Design optimization; Fabrication; Integrated circuit measurements; Integrated circuit synthesis; Integrated circuit yield; Process design; Product design; Textile industry;

fLanguage

English

Publisher

ieee

Conference_Titel

Systems, Man, and Cybernetics, 1997. Computational Cybernetics and Simulation., 1997 IEEE International Conference on

Conference_Location

Orlando, FL

ISSN

1062-922X

Print_ISBN

0-7803-4053-1

Type

conf

DOI

10.1109/ICSMC.1997.625788

Filename

625788