Test generation in a distributed environment

Author

Calia, E. ; Lioy, A.

Author_Institution

Dipartimento Automatica e Info., Politecnico di Torino, Italy

fYear

1991

fDate

2-5 Dec 1991

Firstpage

700

Lastpage

707

Abstract

This paper describes a distributed test generation system for combinational circuits. It is made up of modules running on computers connected via a local area network. Issues in parallelizing the tasks between the various modules are discussed, with comparison to previous work in the field. The concepts of independent faults, independent fault sets, and fault partitioning are shown to be the key points in performing useful parallel computations. Experimental results with a heterogeneous computer network prove that a satisfactory speedup can be obtained, although saturation occurs at a point depending on the circuit´s characteristics

Keywords

automatic testing; combinatorial circuits; local area networks; logic testing; combinational circuits; distributed environment; fault partitioning; heterogeneous computer network; independent fault sets; local area network; modules; parallel computations; test generation; Automatic test pattern generation; Circuit faults; Circuit testing; Computer networks; Concurrent computing; Distributed computing; Fault detection; Fault diagnosis; Parallel processing; Test pattern generators;

fLanguage

English

Publisher

ieee

Conference_Titel

Parallel and Distributed Processing, 1991. Proceedings of the Third IEEE Symposium on

Conference_Location

Dallas, TX

Print_ISBN

0-8186-2310-1

Type

conf

DOI

10.1109/SPDP.1991.218194

Filename

218194