• DocumentCode
    3161994
  • Title

    Backfire-to-endfire radiation characteristics of CRLH-TL using substrate integrated waveguide and metal-patches

  • Author

    Mizumori, Yasunobu ; Okubo, Kensuke ; Kishihara, Mitsuyoshi ; Yamakita, Jiro ; Ohta, Isao

  • Author_Institution
    Okayama Prefectural Univ., Soja, Japan
  • fYear
    2009
  • fDate
    7-10 Dec. 2009
  • Firstpage
    1419
  • Lastpage
    1422
  • Abstract
    We have proposed a new type of the CRLH-TL consisting of two-layer planar substrates recently. It consists of a base waveguide of a substrate integrated waveguide (SIW), and series capacitances realized by slit apertures and metal patchs arranged on the upper conductor of the SIW. It is expected to become one of the basic CRLH-TL structures over 10 GHz or millimeter-wave. However radiation from the metal-patchs cannot neglect in this structure. Then we proposed a leaky-wave antenna using the SIW metal-patch type CRLH-TL. In this paper, beam scan characteristics as a function of driving frequency are confirmed theoretically and experimentally. A SIW metal-patch type CRLH-TL with transition frequency of 16 GHz is designed for a leaky-wave antenna and fabricated. Measured results agree well with theoretical and numerical results.
  • Keywords
    antenna radiation patterns; millimetre wave antennas; substrate integrated waveguides; transmission line theory; CRLH-TL; SIW metal-patches; backfire-to-endfire radiation characteristics; composite right/left handed transmission lines; leaky-wave antenna; millimeter-wave transmission line; series capacitances; slit apertures; two-layer planar substrate integrated waveguide; Antenna measurements; Apertures; Capacitance; Conductors; Frequency; Leaky wave antennas; CRLH-TL; SIW; beam scan; leaky-wave antenna; metal-patch; microwave; millimeter wave;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 2009. APMC 2009. Asia Pacific
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-2801-4
  • Electronic_ISBN
    978-1-4244-2802-1
  • Type

    conf

  • DOI
    10.1109/APMC.2009.5384116
  • Filename
    5384116