DocumentCode :
3162247
Title :
On the effect of system constraints on mechanical integrity of high density packages used in telecommunication applications
Author :
Langari, A.R. ; Morris, W.L. ; Kuhlman, M. ; Hashemi, H.S. ; Dadkhah, M.S.
Author_Institution :
Dept. of Adv. Packagin, Mindspeed Technol. Inc., Newport Beach, CA, USA
fYear :
2001
fDate :
2001
Firstpage :
264
Lastpage :
269
Abstract :
A system level mechanical analysis was performed to optimize the mechanical integrity of a high-density MCM package, employing ball grid array technology, and being used in a telecommunications application. Post manufacturing processes in addition to the system constraints can affect the mechanical integrity of packages already qualified at the component level. The prediction of these large-scale effects and integrating the new insights into the package design guidelines is very important in achieving applications reliability. We have fully analyzed the system behavior of a test structure intended for a high-density telecommunication application. The analysis activities were accelerated using highly integrated internally developed codes, compatible with commercial finite-element-analysis tools. The study included a set of experimental test structures, and a full set of system validation experiments. In this paper, we present the results of this study which proposes a system analysis methodology along with describing the related analysis results, covering the effect of a large set of design parameters effecting the mechanical integrity of the package. These results and methods are being used for design optimization analysis at Mindspeed Technologies Inc
Keywords :
ball grid arrays; finite element analysis; multichip modules; telecommunication equipment; ball grid array; design optimization; finite element analysis; high-density MCM package; manufacturing process; mechanical integrity; system constraints; system-level mechanical analysis; telecommunication equipment; Acceleration; Components, packaging, and manufacturing technology; Design optimization; Electronics packaging; Finite element methods; Guidelines; Large scale integration; Manufacturing processes; Performance analysis; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2001. Proceedings., 51st
Conference_Location :
Orlando, FL
ISSN :
0569-5503
Print_ISBN :
0-7803-7038-4
Type :
conf
DOI :
10.1109/ECTC.2001.927733
Filename :
927733
Link To Document :
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