• DocumentCode
    3162338
  • Title

    Effect of Boundary Conditions on the Dynamic Response Characterization Of Board-Level Drop Test

  • Author

    Park, Seungbae ; Shah, Chirag ; Kwak, Jae

  • Author_Institution
    State Univ. of New York, New York
  • fYear
    2007
  • fDate
    10-12 Dec. 2007
  • Firstpage
    374
  • Lastpage
    379
  • Abstract
    Board-level drop test has emerged as a key qualification test for assessing the impact reliability of electronic components. JEDEC standards for board level drop test address different test board designs, assembly, materials, constructions, tester setup etc. However, it fails to emphasize the effect of varying boundary conditions on the dynamic response of the PCB assembly. Repeated dropping of boards during statistical reliability testing loosens up the mounting screws after a certain number of drops. Also, different sizes, and materials of mounts and supports can produce a significant variation in the vibration response of the PCB assembly. This paper addresses the effect of such boundary conditions and their influence on the overall dynamic characteristics of the system. A novel optical technique has been developed to measure the whole-field impact dynamic response of the PCB. Pair of synchronized high-speed cameras the images of board assembly at rates upto 15,000 pictures per second. A digital image correlation (DIC) system has been integrated with the cameras to analyze the acquired images to give dynamic deformation, shape and strain over the entire surface of board during impact. These measurements are conducted for different standoff heights, varying tightening torques on mounting screws and for rubber shim placement between the support and the board. Modal analysis has been performed on the finite element model for the board assembly to validate the experimental measurements. Furthermore, using spectral analysis, quantitative evaluation of varying boundary conditions has been done to understand their effect on fundamental modes and harmonics. With significant sensitivity observed as regards to these parameters, the need for accurate accounting of the boundary conditions while analyzing a drop test has been underlined.
  • Keywords
    deformation; finite element analysis; image processing; impact (mechanical); integrated circuit reliability; modal analysis; printed circuit design; printed circuit testing; JEDEC standards; PCB assembly; board surface deformation; board-level drop test; boundary condition effects; digital image correlation; dynamic response characterization; electronic component impact reliability assessment; finite element model; image capture; modal analysis; mounting screws; spectral analysis; statistical reliability testing; synchronized high-speed cameras; test board designs; tester setup; vibration response; whole-field impact dynamic response; Assembly; Boundary conditions; Building materials; Cameras; Electronic components; Electronic equipment testing; Fasteners; Materials testing; Optical materials; Qualifications;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference, 2007. EPTC 2007. 9th
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-1323-2
  • Electronic_ISBN
    978-1-4244-1323-2
  • Type

    conf

  • DOI
    10.1109/EPTC.2007.4469810
  • Filename
    4469810