Dielectric breakdown in PLZT 9.5/65/35 ceramics

Author

Furman, E. ; Cross, L.E.

Author_Institution

Dept. of Ceramic Eng., Clemson Univ., SC, USA

fYear

1991

fDate

33457

Firstpage

577

Lastpage

580

Abstract

There is currently a trend to reduce the thickness of the dielectrics and to operate them at higher field levels. Understanding and controlling the breakdown strength will permit higher operating fields. The main goal of this work was to establish the breakdown mechanism in PLZT ceramics. The breakdown experiments were conducted with both hot-pressed and conventional ceramics. The breakdown strength was studied as a function of electrode material, voltage polarity, ramp rate, and temperature. All of the results were consistent with electromechanical breakdown being the dominant mechanism

Keywords

ceramics; electric breakdown; electromechanical effects; ferroelectric materials; lanthanum compounds; lead compounds; piezoceramics; PLZT; PLZT 9.5/65/35 ceramics; PbLaZrO3TiO3; breakdown mechanism; conventional ceramics; dielectric breakdown; electrode material; electromechanical breakdown; high field levels; hot-pressed ceramics; ramp rate; temperature dependence; thickness; voltage polarity; Breakdown voltage; Ceramics; Dielectric breakdown; Dielectric materials; Electric breakdown; Electrodes; Ferroelectric materials; Gold; Powders; Thermal conductivity;

fLanguage

English

Publisher

ieee

Conference_Titel

Applications of Ferroelectrics, 1994.ISAF '94., Proceedings of the Ninth IEEE International Symposium on

Conference_Location

University Park, PA

Print_ISBN

0-7803-1847-1

Type

conf

DOI

10.1109/ISAF.1994.522434

Filename

522434