• DocumentCode
    3162574
  • Title

    Design and thermo-mechanical analysis of a Dimple-Array Interconnect technique for power semiconductor devices

  • Author

    Wen, Simon S. ; Huff, Dan ; Lu, Guo-Quan

  • Author_Institution
    Bradley Dept. of Electr. & Comput. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    378
  • Lastpage
    383
  • Abstract
    A simple wireless-bond interconnect technique, termed Dimple-Array Interconnect (DAI) technique for packaging power devices and modules is presented in this paper. Electrical connections onto the devices are established by soldering arrays of dimples pre-formed on a metal sheet. Preliminary electrical and thermomechanical modeling results on a prototype DAI power module demonstrated potential advantages of this technique to include reduced parasitic noises, improved thermo-mechanical reliability, as well as lowered processing complexity
  • Keywords
    interconnections; power semiconductor devices; semiconductor device noise; semiconductor device packaging; semiconductor device reliability; DAI; Dimple-Array Interconnect technique; electrical connections; parasitic noises; power semiconductor devices; processing complexity; thermo-mechanical analysis; wireless-bond interconnect technique; Electronic packaging thermal management; Integrated circuit interconnections; Multichip modules; Power electronics; Power system interconnection; Semiconductor device packaging; Soldering; Thermal management; Thermomechanical processes; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2001. Proceedings., 51st
  • Conference_Location
    Orlando, FL
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-7038-4
  • Type

    conf

  • DOI
    10.1109/ECTC.2001.927752
  • Filename
    927752