DocumentCode :
3162904
Title :
Low-firing Pb(Mg1/3Nb2/3)O3-PbTiO 3-Pb5Ge2SiO11 compositions for thick film capacitor applications
Author :
Kim, Y.D. ; Landin, S.M. ; Cornejo, I.A. ; Haun, M.J.
Author_Institution :
Dept. of Metall. & Mater. Eng., Colorado Sch. of Mines, Golden, CO, USA
fYear :
1991
fDate :
33457
Firstpage :
585
Lastpage :
588
Abstract :
Commercial ferroelectric thick films have been developed with high dielectric constants for capacitor applications. However, these compositions typically do not densify well in thick film form at characteristic firing temperatures (850~900°C), and thus require encapsulants to provide environmental stability. In this paper, ferroelectric compositions that can be fired at low temperatures with useful dielectric properties for thick film application are presented based on the combination of Pb(Mg1/3Nb2/3)O3 (PMN)-PbTiO3 (PT) with Pb5Ge2SiO 11 (PGS). The PGS melts at ≈724°C, and causes liquid phase sintering of the PMN-PT at low temperatures. Thick film samples of PMN-PT with 30 weight percent PGS and 5 weight percent PbO additions densify to closed porosity fired at 850°C for 10 minutes with a room temperature 1 KHz dielectric constant greater than 1500 and a dissipation factor less than 6%. Preliminary results indicate that these compositions are compatible with a commercial silver thick film conductor paste (DuPont 6160)
Keywords :
ceramic capacitors; ceramics; ferroelectric capacitors; ferroelectric materials; lead compounds; permittivity; porosity; sintering; thick film capacitors; 1 kHz; 10 min; 724 C; 850 to 900 C; PMN-PT-PGS; PMN-PbTiO3-Pb5Ge2SiO11; PbMgO3NbO3-PbTiO3-Pb5Ge2SiO11; closed porosity; commercial silver thick film conductor paste; densification; dielectric properties; dissipation factor; encapsulants; environmental stability; ferroelectric thick films; high dielectric constants; liquid phase sintering; low-firing Pb(Mg13/Nb23/)O3-PbTiO 3-Pb5Ge2SiO11 compositions; room temperature dielectric constant; thick film capacitor applications; Capacitors; Dielectric constant; Ferroelectric materials; Firing; High-K gate dielectrics; Niobium; Silver; Stability; Temperature; Thick films;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applications of Ferroelectrics, 1994.ISAF '94., Proceedings of the Ninth IEEE International Symposium on
Conference_Location :
University Park, PA
Print_ISBN :
0-7803-1847-1
Type :
conf
DOI :
10.1109/ISAF.1994.522436
Filename :
522436
Link To Document :
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