DocumentCode
3163142
Title
Impact Of The Self-heating Effect On Circuit Performance Estimation Using DC Model Parameters
Author
Takace, D. ; Trager, J. ; Schmitt-Landsiedel, D.
Author_Institution
Siemens Ag
fYear
1988
fDate
22-23 Feb. 1988
Firstpage
50
Lastpage
55
Keywords
Circuit optimization; Coupling circuits; MOSFETs; Power measurement; Pulse measurements; Steady-state; Temperature dependence; Temperature distribution; Testing; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronic Test Structures, 1988. ICMTS. Proceedings of the 1988 IEEE International Conference on
Conference_Location
Long Beach, CA, USA
Type
conf
DOI
10.1109/ICMTS.1988.672928
Filename
672928
Link To Document