• DocumentCode
    3163193
  • Title

    Reliability and failure analysis of porcelain high-voltage surge arresters

  • Author

    Rossman, James B. ; Droke, Mark A. ; Nelson, Jeffrey H.

  • Author_Institution
    Transm. Power Quality, Tennessee Valley Authority, Hopkinsville, KY, USA
  • fYear
    2010
  • fDate
    11-14 Oct. 2010
  • Firstpage
    604
  • Lastpage
    607
  • Abstract
    TVA identified an increasing failure rate of 132-kV (106-kV Maximum Continuous Operating Voltage) porcelain arresters on the 161-kV system. A cross-organizational team was formed to determine the root cause of the 19 arrester failures and provide solutions. The team researched arrester failure modes and solicited input from arrester experts. A root cause diagram is discussed and multiple failure modes were ruled out. Multiple failed arrester units were dissected indicating moisture ingress as the root cause leading to the recent failures. Computer simulations contrasted faults through the Metal Oxide Varistor (MOV) block stack versus faults flowing through the air cavity surrounding the MOV stack. All 19 failures were recorded by digital fault recorders (DFR). The DFR waveforms were compared to the computer simulations showing that the arresters flashed over the internal air cavity. Based on the available physical evidence, moisture ingress is the likely root cause issue for the failures from 2002 to date.
  • Keywords
    arresters; failure analysis; porcelain insulators; power system reliability; recorders; varistors; TVA; digital fault recorders; failure analysis; high-voltage surge arresters; metal oxide varistor; moisture ingress; porcelain arresters; reliability; voltage 132 kV; voltage 161 kV; Arresters; Atmospheric modeling; Circuit faults; Integrated circuit modeling; Moisture; Porcelain; Surges;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Voltage Engineering and Application (ICHVE), 2010 International Conference on
  • Conference_Location
    New Orleans, LA
  • Print_ISBN
    978-1-4244-8283-2
  • Type

    conf

  • DOI
    10.1109/ICHVE.2010.5640776
  • Filename
    5640776