DocumentCode :
3163226
Title :
Mechanical bending fatigue reliability and its application to area array packaging
Author :
Skipor, Andrew ; Leicht, Larry
Author_Institution :
Adv. Technol. Center, Motorola Lab., Schaumburg, IL, USA
fYear :
2001
fDate :
2001
Firstpage :
606
Lastpage :
612
Abstract :
The drive to finer pitch assemblies is in part due to smaller portable products. As these products reduce in size, the thickness of the printed circuit board must also reduce in thickness in proportion to the product size. These assemblies have become more flexible. Many of these products are assembled with area array packaging, which require numerous low-frequency mechanical deflections. The reliability emphasis has become more focused on isothermal bending fatigue. This paper will discuss a test method to evaluate bending fatigue reliability of 1.0 and 0.8 mm pitch area array packaging, the effect of printed circuit board (PCB) thickness, fatigue fracture morphology and its relation to solder joint location. Finite element results will also be presented to support and expand upon the findings in this study
Keywords :
bending; fatigue; fine-pitch technology; finite element analysis; packaging; reliability; 0.8 mm; 1.0 mm; area array packaging; fine-pitch assembly; finite element analysis; flexible printed circuit board; fracture morphology; isothermal bending fatigue; mechanical deflection; portable product; reliability; solder joint; Assembly; Circuit testing; Fatigue; Finite element methods; Flexible printed circuits; Isothermal processes; Morphology; Packaging; Printed circuits; Soldering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2001. Proceedings., 51st
Conference_Location :
Orlando, FL
ISSN :
0569-5503
Print_ISBN :
0-7803-7038-4
Type :
conf
DOI :
10.1109/ECTC.2001.927791
Filename :
927791
Link To Document :
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