• DocumentCode
    3163262
  • Title

    Determination Of Process-dependent Critical SPICE Parameters For Application-specific ICs

  • Author

    Sheu, Bing J. ; Wan, Chung-Ping ; Shih, Chih-Ching ; Wen-Jay Hsu ; Hsu, Ming C.

  • Author_Institution
    University Of Southern California
  • fYear
    1988
  • fDate
    22-23 Feb. 1988
  • Firstpage
    73
  • Lastpage
    78
  • Keywords
    Application specific integrated circuits; Circuit analysis; Circuit simulation; Circuit testing; Computational efficiency; Computational modeling; Fabrication; MOSFETs; SPICE; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronic Test Structures, 1988. ICMTS. Proceedings of the 1988 IEEE International Conference on
  • Conference_Location
    Long Beach, CA, USA
  • Type

    conf

  • DOI
    10.1109/ICMTS.1988.672932
  • Filename
    672932
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3163262